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首页 > 供应 > 光伏生产设备 > 电池片生产设备 > 检验/测试设备/分选机 > Spire Corporation > One-Sun Solar Cell Tester
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One-Sun Solar Cell Tester
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  • 发布时间:2015-11-05 15:10

产地:海外 | 归属行业:检验/测试设备/分选机

品牌:spire

有效期至:长期有效

联系人: spirecorporation

电话: 781-275-6000

主营: 设备和太阳能光伏组件交钥匙生产线、工程、采购和施工(EPC)的太阳能系统集成服务

联系地址:One Patriots Park Bedford, MA 01730-2396 (USA)

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One-Sun Solar Cell Tester
The Spi-Cell Tester™ tests the electrical performance of photovoltaic cells under simulated sunlight. A xenon arc lamp with an optical filter provides a close match to the Air Mass 1.5 Global (AM1.5G) solar spectrum.
The Spi-Cell Tester measures current-voltage (I-V) characteristics of cells with dimensions up to 156 mm x 156 mm at 1 sun intensity. Its high resolution also permits testing of very small area devices. Separate current and voltage probes on the top and bottom of the cell permit four-point (Kelvin) I-V measurements. A calibrated monitor cell is located on the test plane to monitor the light intensity.
A computer with user friendly software adjusts the lamp intensity, controls the measurement process, and acquires cell performance data. A programmable electronic load varies the resistance across the cell to measure its I-V characteristics. The computer plots the I-V curve and displays a variety of cell characteristics. Curves and data can be printed and stored on disk.



 

Features and Benefits
  • Measures and displays the following cell parameters:
    • Complete I-V curve
    • Open circuit voltage, Voc
    • Short-circuit current, Isc
    • Cell temperature, °C
    • Peak power, Pmax
    • Cell efficiency, η
    • - Fill factor, FF
    • Series resistance, Rs
    • Shunt resistance, Rsh
  • Illumination uniformity within ±2% at 1 sun
  • Xenon light source filtered to Class A spectrum (AM1.5G) for intensities from 70 to 110 mW/cm²
  • Calibrated reference cell traceable to NREL
  • Four point probe for accurate measurements
  • Temperature controlled vacuum chuck using a closed loop water chiller
  • Computer system and software package for operation, measurements, data analysis, printed output, and disk storage


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